Visit us at our stand in Hall 10/D28, Fraunhofer-Business Area Cleaning. We will be glad to welcome you there from September 26 to 28!
International Trade Fair for Industrial Parts and Surface Cleaning.
at the stand of Fraunhofer-Business Area Cleaning
Hall 10/D28
We will be showcasing measuring systems for automated 100 percent inspection of surfaces. The systems are mainly based on the technique of fluorescence imaging analysis. This method can be used to detect and quantify both particulate and filmic contamination directly on the component surface.
Testing of components for filmic contamination in the production line must be fast, non-contact, sensitive and comprehensive. Full inspection is essential because functional surfaces with higher cleanliness requirements, such as bonding grooves, surfaces to be joined or painted, are often extensive and the distribution of contamination is rarely homogeneous.
Our solutions for inline component inspection are based on the fact that filmic contaminants usually fluoresce and that quantitative detection is possible with the aid of fluorescence:
The F-Scanner 1Dmini inspects formed parts, detecting contaminations on the relevant areas of large components quantitatively and with high spatial resolution in the production cycle. The robot-assisted, imaging inspection system examines those parts of a component for which special cleanliness requirements apply, e.g. due to subsequent welding or bonding. Due to the high depth of field, any free-form parts can be inspected rapidly.
The F-Camera mini enables very sensitive imaging inline inspection of component surfaces. The inspection system detects impurities or the quality of coatings quantitatively every second with a resolution down to the micrometer range. The F-Camera mini is suitable for inspecting reflective or even rough surfaces. Thanks to fluorescence measurement technology, the system detects organic substances on metallic surfaces particularly sensitively: Filmic residual impurities down to a few 10 nm thick are reliably detected.
Fraunhofer Institute for Physical Measurement Techniques IPM