Measurement technology for structure and material analysis

Fraunhofer IPM disposes of extensive equipment and numerous methods for analyzing developed, functional materials and surfaces.

  • 3D Computed Tomography (CT)
  • Ellipsometry
  • Profilometry
  • Scanning electron microscope (SEM) with energy dispersive X-ray spectroscopy (EDX) and electron backscatter diffraction (EBSD)
  • Laser scanning microscope
  • Fluorescence measuring system
  • Multi-wavelength holography measurement system