The Supervised Deep Learning method
We primarily use AI methods from the field of supervised deep learning for our application-specific, high-precision data analysis solutions. In this approach, an algorithm learns to recognize objects based on manually labeled training data. Artificial neural networks (ANNs) are trained using appropriate datasets to accomplish this. An accurate ANN is essential for automated data analysis. ANNs learn the corresponding output patterns for specific input patterns. Based on this "experience" new, unknown input data can be analyzed in real time. ANNs have proven very robust against variations in characteristic colors, edges, or shapes. Data sources for automated object recognition can include 2D camera data, 3D scan data (point clouds), or fused data.
In principle, Supervised Deep Learning can be applied to any type of object or scenario. Such objects can include parked cars, damage to concrete bridges, fastening bolts on railroad tracks, and door and window openings in buildings, for example. The approach is superior to traditional geometric recognition algorithms for 2D image data or 3D point clouds because it readily adapts to slight variations in measurement data, such as colors, lighting, and object shapes.
Optimization and real-time AI
In terms of complex data analysis problems, AI approaches often demonstrate significantly more power than traditional algorithms. However, AI-based solutions require considerably more computing power, often in the form of dedicated accelerators, such as graphics cards. To make the use of AI as cost-effective as possible, we optimize the AI and the entire software chain in accordance with the available hardware.
Depending on the application, this may also involve optimizing for less powerful edge hardware or embedded platforms. In such cases, AI-based interpretation of measurement data can happen directly within the measurement system in real time. This yields immense systemic advantages by eliminating the effort required for data handling, storage, and post-processing. The result is available immediately after the measurement.